商品编号


Leica TCS SP8 SMD | Single Molecule Detection Platform



品牌


Leica(徕卡)



公司


Leica



公司分类


Confocal Microscopes





商品信息

Single molecule detection (SMD) and analysis is an elegant way to examine dynamics and interactions inside cellular systems. The new
Leica
TCS SMD Series perfectly integrates the confocal microscope
Leica
TCS SP8 and the SMD specific software and hardware from PicoQuant into one system.

The well proven components constitute a flex
IBL
e platform for a plethora of time resolved techniques including FCS , FCCS, FLIM?and FLCS. The global system control and its elegant interface open the door to a multitude of biophysical techniques which provide quantitative parameters for model building.










Global experiment control by full system integration



With the full integration of all components the user can control the complete experiment via one interface. Dedicated application wizards provide reproduc
IBL
e results quickly and easily. The high degree of automation allows new recording strategies. Online SMD data display and interactive feedback grants a tight control of data quality.












Spectral and lifetime information at once – Combine the power!



The combination of a
Leica
TCS SP8 X white light laser system with spectral FLIM detection results in a tuneable, filter free FLIM system. Highest FLIM data quality is achieved by tuning both, excitation and detection to the optimal spectral range. Using the convenience of the SMD FLIM wizard, automated FLIM excitation and detection stacks can be acquired, which is very useful to separate fluorescence of multiple stained samples and to characterize new dyes.














Quick Results - better data reli
ABI
lity



The online display of important statistical control parameter such as the correlation curve and fast FLIM image, the count rate, the molecular brightness or the maximal photon count number allow the continuous evaluation of the data quality during the running FCS or FLIM experiment. SMD data can be already interpreted during the measurement series.












Maximum flexibility in SMD analysis



Due to a universal SMD raw data format the very same data file can be analyzed in different ways. Depending on hardware and experimental design, both correlation and lifetime information can be extracted from a single measurement yielding a maximum of information about the sample. FCS systems can be upgraded with FLIM and vice versa to achieve the most flex
IBL
e FLCS configuration.